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The future of wafer inspection is here… Computational Parallel Inspection®

What we do

Exnodes is a Silicon Valley company specializing in modern sensors, electronics, optics, mechanics, and high-speed digital processing. We are inventors, designers and developers working toward eliminating problems with chip yields in leading edge semiconductor fabrication.

The Problem

Low yields in semiconductor chips is both expensive and time consuming for manufacturers. Defects occur at the nanoscale level, making detection difficult throughout the fabrication process.

The Solution

Our computational imaging and machine learning technology enables rapid detection, identification and root-cause analysis necessary to eliminate these nanoscale defects, thereby increasing fabrication yields and preserving resources.

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The Future of Wafer InspectionTM